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SIOS: Precision redefined: Simultaneous length and angle measurement - why pure length measurement WITHOUT simultaneous angle measurement is no longer state-of-the-art

The challenge in measurement technology: simultaneous length and angle measurement
In precision measurement technology, there is a central challenge for measurement technicians, engineers, and production managers: the measurement of lengths and angles must not only be precise, but must also function efficiently and reliably under real conditions. Thermal influences in particular, which often occur in production environments, present a challenge. Temperature changes can distort measurements and lead to incorrect results. It is crucial that changes in length as well as pitch and yaw angles are recorded simultaneously in order to obtain reliable data - a standard that is essential for high-precision applications today.
SIOS: Precision in Theory and Practice: Participants enthusiastic about SIOS practical seminar on simultaneous displacement and angle measurement

On June 26, 2024, the first SIOS practical seminar on simultaneous displacement and angle measurement with a focus on the compensation of Abbe errors took place at our premises in Ilmenau. We welcomed a small group of six experts from renowned companies.
SIOS SL 03 mini Frequency Stabilized HeNe Laser: Compact frequency stabilized HeNe laser

The compact laser of the SIOS SL-03 mini series was designed as a cost-optimized version of a HeNe laser and is ideally suited for OEM use. The laser has a very good frequency stability and can be equipped with compact electronics. The cable lengths are variable and a connection of further optical components like isolator or a fiber coupling is possible.
SIOS SL 04 Frequency and Amplitude Stabilized HeNe Laser: Frequency and amplitude stabilized HeNe lasers

SIOS stabilized HeNe lasers of the SL-04 series are operated with an external supply unit and thus enable the maximum variation of technical target specifications. In the standard version, solutions with pure frequency stabilization and combined frequency and amplitude stabilization are offered. Lasers of the SL-04 series can meet the highest requirements for frequency stability and can be used for single projects as well as OEM solutions.
SIOS NPP-1 Nanopositioning Platform: Planar laser interferometric measurement and positioning system for AFM

The SIOS NPP-1 nanomeasurement and positioning platform allows positioning in a range of about 100 mm. The high resolution of the laser interferometers used for control, the rigid architecture of the positioning system, the air-bearing axes of the positioning system and an optimized control system allow the position deviations and path fidelity of the movements < 2 nm RMS.
SIOS EPP Gauge Block Calibration System: Highly accurate gauge block calibration system

The SIOS EPP gauge block calibration system for calibrating gauge blocks uses an LM 20 laser interferometric probe as the upper measuring probe. It has a measuring range of 20 mm and a resolution of 1 nm.
SIOS LSV 120 NG/L Vibrometer with exchangeable lens attachment

The use of an exchangeable lens attachment in combination with focusing lenses of different focal lengths makes this version of the SIOS LSV 120 NG vibrometer a universal vibration measurement system, especially for the fields of product development and research.
SIOS LSV 2500 NG Vibrometer with variable focal length

The SIOS LSV 2500 NG series of vibrometers with manual zoom lens offers maximum ease of use and flexibility and is based on the LVS 120 NG sensor.
SIOS SP 5000 TR Triple beam laser interferometric measuring system for simultaneous and accurate length, pitch and yaw angle measurements

SIOS SP 5000 TR triple beam laser interferometers are precision length measuring instruments that combine three interferometers in one device. All three measuring channels are fed by one light source with the same highly stable laser frequency. Thus, three length values can be measured simultaneously with nanometer accuracy. From the difference between two length values and the calibrated beam distance, the corresponding angle can be determined with high resolution and high precision.
SIOS SP 5000 DS Double beam laser interferometer for simultaneous and accurate length and angle measurements

SIOS SP 5000 DS double-beam laser interferometers are used for measuring tasks that require simultaneous acquisition of an angle of motion in addition to length information.
SIOS SP 5000 DI/F Differential Laser Interferometer: Ultra stable compact differential laser interferometer

The SIOS ultra-stable differential laser interferometer SP 5000 DI is characterized by a unique thermal stability and is therefore preferred for long-term measurements in research and development, e.g. for the analysis of material properties.
SIOS SP 5000 DI Differential Laser Interferometer: Highly stable differential laser interferometer with two parallel measuring beams

The SIOS ultra-stable differential laser interferometer SP 5000 DI is characterized by a unique thermal stability and is therefore preferred for long-term measurements in research and development, e.g. for the analysis of material properties.
SIOS SP 15000 NG Long-Range Laser Interferometer: Laser interferometric measurment system for high-precision length measurements over long distances

The SIOS SP 15000 NG long range laser interferometer was specially designed for length measurements over long distances and builds consistently on the SP 5000 NG product family.
SIOS SP 5000 NG Laser interferometer: Laser interferometric measurement system for high-precision length measurements

High-precision and reliable results are essential for length measurement and calibration on guides, measuring, microscope and positioning stages, coordinate measuring machines and machine tools as well as for multi-coordinate measurements. The SIOS universal laser interferometer SP 5000 NG is the solution for your high-precision length measurement and can be completed at any time with additional components from the product family for your new measurement project.
SIOS Nano Vibration Analyzer NA: Vibrometer system for microstructures and MEMS

The SIOS Nano Vibration Analyzer NA is a combination of a fiber-coupled vibrometer of the LSV 120 NG series with an engineering microscope. The system is ideally suited for measuring the dynamic behavior and static deflection of microstructures, MEMS and cantilevers. Depending on the objective used, a measurement spot size of less than 2 µm can be achieved.
SIOS Webinar 19 January 2023: High-precision simultaneous displacement and angle measurement

In this upcoming SIOS webinar: High-precision simultaneous displacement and angle measurement, SIOS experts will give you insights into the theory and practice of length and angle measurement technology. You will learn which factors have an influence on measurement uncertainties, how to realize an Abbe error-free measurement setup or compensate for Abbe errors and for which application areas the measurement systems are suitable.
SIOS: Nanomeasuring machine finds its way into mechanical engineering

The SIOS Nanopositioning and Nanomeasuring Machine NMM-1 was installed in the R&D department of BE Semiconductor Industries NV (Besi), who design and manufacture state-of-the-art assembly systems and equipment for leadframe, substrate and wafer-level packaging applications in a variety of end-use markets, including electronics, mobile internet, cloud server, computer, automotive, industrial, LED and solar energy.
SIOS: Displacement-angle differential interferometer captures multiple degrees of freedom

Currently, used measurement methods in industrial manufacturing are reaching the limits of what is technically feasible. SIOS experts develop high-precision measurement technology to precisely determine positioning or surface modifications with tolerances in the nanometer or even picometer range, for example.
SIOS: Manufacturing process for the kilogram awarded as a top achievement.

When we go shopping and throw a bag of sugar weighing one kilogram in the shopping cart, we rely on it actually weighing one kilogram. One gram more or less does not usually bother us. Even during the shopping trip, a grain of sugar can fall out, which weighs 0.0004 g on average. We cannot even determine this loss with our kitchen scales.
SIOS Webinar: High precision thickness measurements using tactile probes

The general ongoing trend towards precision, miniaturization and automation in industry and research places high demands on precision measurement systems, which are expected to detect the geometrical dimensions of objects.
SIOS: Why high-definition displays and ultra-stable measuring technology form the perfect match

Today’s technological developments follow a common trend in many industrial sectors: products are becoming more complex, more powerful and larger, with components and object structures becoming smaller and more compact.
This statement also applies to display manufacturing technology – one of the main applications for the differential interferometer SP 5000 DI developed by SIOS.
Five reasons why you should choose frequency-stabilised HeNe Lasers from SIOS

As a dedicated developer, purchaser or person responsible for quality assurance, you know that: sometimes the standard product from the catalog fits, sometimes the requirements are so special that an individual solution is needed. In both cases, SIOSis the right partner for you.
SIOS LCS-Series Climate Measuring Station
SIOS SL 02 Frequency Stabilized HeNe Laser: Frequency-stabilized HeNe lasers as measuring standard for laser-optical metrology and as frequency standard

The SIOS frequency-stabilized HeNe lasers of the SL-02 series with a wavelength of 632.8 nm are used as a natural, highly stable measuring standard and as a frequency standard. The stabilization electronics and the high voltage supply are integrated in the laser tube. This simplifies integration of the laser into a customer setup.
SIOS PT Series Testing Rig for Applanation Tonometers

The SIOS PT Series Testing Rig for Applanation Tonometers is an interference-optical test device for applanation tonometers consists of an automated laser-optical test apparatus with USB interface and evaluation software for PC/laptop.
SIOS LM 20/50 High linearity probe: Fiber-coupled, highly linear probe for high-precision tactile thickness measurement and calibration

The SIOS LM series laser interferometric probes are precision linear encoders. With these probes, tactile measurements are possible over a measuring range of 20 or 50 mm with nanometer accuracies. The highly linear length gauges are compatible with conventional measuring systems due to their size and the clamping shaft diameter of Ø 8 mm h6.
SIOS LSV 120 NG Vibrometer with fixed focal length

Many applications in industry and research require highly precise and informative vibration analysis on a wide variety of surfaces. Non-contact vibration and length measurement on surfaces of any roughness and under industrial operating conditions can be realized very precisely and quickly with the SIOS LSV 120 NG vibrometer.
SIOS NMM-1 Nanopositioning and Nanomeasuring Machine: Positioning, manipulation, processing and measurement of objects and structures with nanometer accuracy

The SIOS NMM-1 nanopositioning and nanomeasuring machine for three-dimensional coordinate measurement operates in a measuring range of 25 mm x 25 mm x 5 mm with a resolution of 0.1 nm. A special sensor arrangement ensures a measurement free of aberrations in all three coordinate axes. The measuring axes of three miniature interferometers intersect virtually at the point of contact between the probing sensor and the measured object.
SIOS SP15000 C5 Calibration Laser Interferometer for high-precision simultaneous measurement and calibration of length, pitch angle, yaw angle and straightness on positioning axes

The SIOS SP 15000 C5 calibration laser interferometer was specially developed to meet the high demands of machine and equipment manufacturers. All measured variables such as length, pitch angle, yaw angle as well as straightness in x- and y-alignment are recorded with high precision by laser interferometry, whereby the same highly stable laser frequency is used in all three length measurement channels. This enables synchronous, continuous 5 DOF measurements. Complete machine acceptance or volumetric compensation can be implemented using the optional software.