Helmut Fischer Automation

Designed for quality control in the semiconductor industry, the Helmut Fischer FISCHERSCOPE® X-RAY XDV®-μ SEMI accurately measures microstructures on wafers – fully automatically. The whole automation unit is enclosed and therefore perfectly suited for use in clean rooms. FOUP and SMIF pods can be automatically docked to the measuring system. The handling and measurement inside the XDV-μ SEMI takes place entirely without manual intervention. Thanks to pattern recognition, the XRF gauge locates the specified measuring positions precisely and reliably. This automatic measuring process rules out damage and contamination caused by manual handling and ensures high throughput rates for inspecting valuable wafers.

The FISCHERSCOPE® X-RAY 5000 system continuously measures the layer thickness of thin layers on large-area substrates, for example in photovoltaics. The devices in this series form modular units that are easy to install in production lines. The X-RAY 5000 can be operated either in normal atmosphere or under vacuum. Furthermore, the XRF device is designed to be easy to maintain: the measuring head can be serviced without having to release the vacuum.

The Helmut Fischer FISCHERSCOPE® X-RAY 4000 is designed for measuring coating thicknesses during the strip electroplating process, for checking stamped parts and hot air solder-leveled strips or metal coatings on foils, for example. During the measurement, the galvanized strip is scanned using X-ray fluorescence analysis. The measurement results are both accurate and reliable. Fast mechanics for moving the measuring head around make it possible to take measurements at various places on the test piece. Due to the modular system architecture, the XRF measuring instrument can be adjusted according to your individual needs. If required, a second measuring head can even be installed for measuring the front and back of a product.

The modular measurement system Helmut Fischer FISCHERSCOPE® MMS® Automation is the ideal solution for inline coating thickness measurement and material testing. Its standardized interfaces enable rapid integration in quality management systems and automated manufacturing processes. Whether you’re testing with just one probe on the head of an industrial robot or you’re working with up to four probes in parallel in a measuring station directly in your production line: The MMS Automation puts all of Fischer’s electromagnetic measurement methods at your fingertips.