SIOS Measurement and Calibration Systems

SIOS EPP Gauge Block Calibration System: Highly accurate gauge block calibration system

The SIOS EPP gauge block calibration system for calibrating gauge blocks uses an LM 20 laser interferometric probe as the upper measuring probe. It has a measuring range of 20 mm and a resolution of 1 nm.
SIOS PT Series Testing Rig for Applanation Tonometers

The SIOS PT Series Testing Rig for Applanation Tonometers is an interference-optical test device for applanation tonometers consists of an automated laser-optical test apparatus with USB interface and evaluation software for PC/laptop.
SIOS NMM-1 Nanopositioning and Nanomeasuring Machine: Positioning, manipulation, processing and measurement of objects and structures with nanometer accuracy

The SIOS NMM-1 nanopositioning and nanomeasuring machine for three-dimensional coordinate measurement operates in a measuring range of 25 mm x 25 mm x 5 mm with a resolution of 0.1 nm. A special sensor arrangement ensures a measurement free of aberrations in all three coordinate axes. The measuring axes of three miniature interferometers intersect virtually at the point of contact between the probing sensor and the measured object.