In this upcoming SIOS webinar: High-precision simultaneous displacement and angle measurement, SIOS experts will give you insights into the theory and practice of length and angle measurement technology. You will learn which factors have an influence on measurement uncertainties, how to realize an Abbe error-free measurement setup or compensate for Abbe errors and for which application areas the measurement systems are suitable.

Quality assurance through precise alignment of motion and positioning systems

From the optics to the semiconductor industry to medical technology, as well as for calibration tasks, the very highest accuracy is required. Applications such as measurements on guideways, measuring, microscope and positioning stages, pitch and yaw angle correction for two- or multi-coordinate measurements, calibration of measuring machines and machine tools require precise alignment of motion and positioning systems and are crucial for quality assurance.

The problem here is that many of these measurements take place in production environments that cannot provide optimum laboratory conditions, i.e. the technology used is exposed to fluctuating environmental influences such as temperature and air pressure. It is therefore important for the user that the measurements can be made quickly and easily.

With SIOS precision measurement systems such as the SP 5000 TR laser interferometer, displacement and angle measurements:

  • highly precise
  • highly dynamic
  • simultaneous and
  • high-resolution 

be carried out.
At the end, we will be happy to answer your questions.

Time:
08:30 AM or 3:30 PM CET, Berlin

(Corresponding to 6:30PM 19 January 2023 or 1:30AM 20 January 2023 AEDT, Sydney.)

Seminar venue:
Online Clickmeeting

Language:
English

Target group:
Practice-oriented metrology technicians, engineers, designers, quality managers, production planners and project managers

Industries: 
Metrology, nanopositioning, coordinate metrology, optics industry, precision instrumentation, research and development

 

 

 

 

Metrology