The SIOS Nano Vibration Analyzer NA is a combination of a fiber-coupled vibrometer of the LSV 120 NG series with an engineering microscope. The system is ideally suited for measuring the dynamic behavior and static deflection of microstructures, MEMS and cantilevers. Depending on the objective used, a measurement spot size of less than 2 µm can be achieved.

The measured object can be positioned and scanned over a wide range using an X-Y stage and can be observed through a camera. The microscope objective is interchangeable and defines both the visible range and the laser spot diameter. The achievable displacement resolution of the laser interferometric vibrometer is in the picometer range, and vibration frequencies up to 5 MHz can be analyzed.

A specially developed software is offered for the acquisition and display of the measurement data. In addition to frequency analysis of the vibration and triggered measurement recording, this software enables control of the X-Y table and an external frequency generator. More extensive measurement sequences can be automated via scripts.

Read Application Example here.

Download technical datasheet here.

Download product brochure here.

  • Vibrometer system for microstructures and MEMS
  • high-precision, non-contact vibration measurement on micro-objects
  • easy adjustment and handling
  • extensive trigger options
  • X-Y table 50 mm x 50 mm, other options on request
  • Microscope objective 10x, 20x, 50x
  • Spot diameter 2 µm - 10 µm, (depending on objective)
  • OEM use of the vibrometer unit is possible
  • open interfaces for OEM software under Windows and Linux
  • FFT software for spectral analysis

 Areas of application

  • vibration and displacement measurement on microcomponents, MEMS
  • non-contact vibration measurement on surfaces of any roughness
  • determination of vibration spectra
  • determination of vibration modes
  • determination of natural frequencies on microobjects and macroscopic components
  • multi-coordinate measurements with multiple systems

Ideal for

  • quality control
  • development
  • science / research
  • OEM applications

Metrology