Ametek's ModuLab XM MTS is configurable design for materials, electrochemistry and photovoltaic measurements.
- Widest impedance range - µohms to >100 Tohms
- Instant switching between time Domain (IV, fast pulse) and AC (C-V, impedance, Mott-Schottky) measurements without changing sample connections
- Low frequency to 10 µHz for degradation, trap state and material purity studies
- Plug and Play options include – Femto and Sample/Reference modes (for dielectric/insulators)
- XM-Studio software is included with all XM Series systems
- ModuLab XM MTS impedance accuracy contour plot highlights Solartron's best in class measurement performance.
ModuLab XM MTS
Our line of Materials Test Systems test combined electrical, thermal, and mechanical properties of dielectrics, insulators and electronic materials. These systems include specialized accessories: High Voltage Amplifiers, Cryostats, Furnaces, and Sample Holders for liquids, powders, and solid materials.
The ModuLab XM MTS can perform time domain (DC) and frequency domain (AC) tests. Accessories control temperature from cryostat to furnace level and integrate through software control with the core measurement electroncis to create a sustem to study a wide ranges of mateirals. As with other ModuLab plarogn systems it can be expanded for electrochemical or photoelectrochemical experiments.
The Materials Lab XM users the same XM based platform to deliver ModuLab performance to a focused application, the study of Materials. This focused design allows this instrument to occupy a small footprint. ModuLab software includes integrated equivalent circuit analysis, MultiSine and Harmonic Analysis for non-linear materials.
The 1260A Gain-Phase Analyzer (or Frequency Response Analyzer) is the cornerstone of FRA technology. The 1260A can be used as a stand-alone unit, but its applications to Materials is greatly expanded when combined with the 1296A Dielectric Interface. This solution measures at both high-frequency and high-impedance.