Ametek's Materials Lab XM has an application-focus design for dielectric and electronic materials.
- Impedance range from 1 mOhm to 1 TOhm (1E15 Range)
- Small footprint and application-focus design
- Auxiliary measurement port for synchronized measurement of optical, mechanical or other transducers.
- Instant switching between time Domain (IV, fast pulse) and AC (C-V, impedance, Mott-Schottky) measurements without changing sample connections
- Low frequency to 10 µHz for degradation, trap state and material purity studies
- XM-Studio software is included with all XM Series systems
- Materials Lab XM impedance accuracy contour plot highlights Solartron's best in class measurement performance.
Materials Lab XM
Our line of Materials Test Systems test combined electrical, thermal, and mechanical properties of dielectrics, insulators and electronic materials. These systems include specialized accessories: High Voltage Amplifiers, Cryostats, Furnaces, and Sample Holders for liquids, powders, and solid materials.
The ModuLab XM MTS can perform time domain (DC) and frequency domain (AC) tests. Accessories control temperature from cryostat to furnace level and integrate through software control with the core measurement electroncis to create a sustem to study a wide ranges of mateirals. As with other ModuLab plarogn systems it can be expanded for electrochemical or photoelectrochemical experiments.
The Materials Lab XM users the same XM based platform to deliver ModuLab performance to a focused application, the study of Materials. This focused design allows this instrument to occupy a small footprint. ModuLab software includes integrated equivalent circuit analysis, MultiSine and Harmonic Analysis for non-linear materials.
The 1260A Gain-Phase Analyzer (or Frequency Response Analyzer) is the cornerstone of FRA technology. The 1260A can be used as a stand-alone unit, but its applications to Materials is greatly expanded when combined with the 1296A Dielectric Interface. This solution measures at both high-frequency and high-impedance.
Applications and Software
The Materials Lab XM can perform time domain (DC) and frequency domain (AC) tests. Accessories control temperature from cryostat to furnace levels and integrate through software control with the core measurement electronics to create a system to study a wide range of materials. ModuLab XM platform systems can be expanded for electrochemical or photoelectrochemical experiments.
Materials Lab XM’s impedance accuracy contour plot highlights Solartron’s best in class measurement performance.
| The Materials Lab XM is a modular system that can be configured for the following applications: | |
| Dielectric Materials |
Ferro/piezoelectrics | MEMs | NEMs| multiferroics | Polymers | Solid oxides SOFC | ionic conductors | Solid electrolytes, quantum dots |
| Electronic Materials |
LED | LCD | OLED | MEMs | OPV | Si | DSSC | OFET | Ge | GaAs | Perovskite materials |
Download Materials Lab XM brochure here.
Material Analysis - Modulab XM MTS Materials Test System