Mad City Labs MadAFM™ is a new sample scanning atomic force microscope (AFM) designed for ease-of-use and simple installation. The MadAFM™ includes our industry leading closed loop nanopositioners for precision movement of the sample and probe. Mad City Labs has designed and manufactured piezo closed loop nanopositioners for over 25 years. Our nanopositioners offer the lowest noise and highest resolution available due to our proprietary PicoQ® sensors. These sensors are renowned for their ultra-low noise performance. Our nanopositioners have a proven track record with our high performance resonant probe AFMs yielding true decoupled motion with virtually undetectable out-of-plane motion.
In addition to XYZ nanopositioners, the MadAFM™ integrates our intelligent control, high stability motorized micropositioners. These micropositioners allow long range motion of the sample (XY), focus control, and motion of the AFM head (Z). The focus, AFM head, and probe positioners are vertically aligned and coaxial which allows direct on-axis views of the sample surface and cantilever using a 1.6MP CMOS camera. Sample illumination is via a coaxial white LED while the 635nm laser alignment is via camera aided manual operation. MadAFM can accomodate samples up to 50mm x 50mm x 40mm in size. MadAFMsupports multiple microscopy modes (see specification table) and includes AFMView®-OD software that handles all hardware control and data acquisition. The user-friendly software features automated calibration and initialization to allow even novice users to get up and running quickly. The software allows advanced users to have access to specified parameters. MadAFM™ is compatible with 3rd party analysis software MountainsSPIP® and Gwyddion.
MadAFM™ is sized for table tops and simple to installwith minimal user setup.
MadAFM requires vibration and acoustic isolation which is sold separately. All installation is by the user.
Features
- Low noise atomic step performance
- Calibrated flexure guided closed loop nanopositioners
- Less than 1nm out of plane motion over scan range
- Proprietary PicoQ® low noise sensors
- Long travel, high stability micropositioning
- Automated calibration and initialization
- Automated software and hardware setup
- Adjustable parameters for experienced users
- User-friendly probe exchange
- Simple to install, table top design
- Includes AFMView® software - hardware control & data acquisition
- Image analysis software option
Applications
- Atomic Force Microscopy
- Phase Microscopy
- Magnetic Force Microscopy
- Electric Force Microscopy
- Lateral Force Microscopy
- Scanning Tunneling Microscopy
- Kelvin Probe Microscopy
- Conductive AFM
- Electric Force Microscopy
- Piezoelectric Force Microscopy
- Nanolithography
- Biological AFM