Speed meets precision: Built for maximum speed, highest precision, and intuitive ease of use – that's how Fischer introduce the new generation of XRF instruments with their FISCHERSCOPE® XDV®. As one of their high-end XRF solutions, the instrument is designed for measuring on microstructures with confidence. Combined with our cutting-edge FISIQ® X software, the device delivers outstanding measuring performance. In addition, simplified and efficient workflows ensure smooth measurement processes and significantly increased throughput in your quality control.
At-a-glance:
- Unparalleled precision with optimized measurement geometry
- High-speed Z-axis for super-fast sample positioning
- Enhanced usability and user guidance with FISIQ® X software
Features:
- Super-fast sample positioning: High-speed Z-axis 6 x faster*
- Rapid sample capture: Autofocus in under 2 seconds – 14 x faster*
- Automated operation: Automated or manual hood for maximum flexibility
- Optimum sample illumination and picture capture: 10 x higher* camera resolution and multizone LED lighting
- * In comparison to FISCHERSCOPE® X-RAY XDV®-SDD.
- Unparalleled high precision and repeatable results: Optimized measurement geometry
- Device status always visible: Intuitive 180° status light
- Enhanced usability and user guidance: New FISIQ® X software
Achieve fast, ultraprecise measurements with simplified and efficient workflows, even in the most challenging applications like wafer analysis. Meet FISIQ-X now, the first XRF software with AI technology!
Always keep everything in view with the high resolution overhead camera. Whether matte, glossy or reflective surface, the multizone LED lighting reveals every detail with precision.
Choose between automated and manual operation, enhanced by a motorized hood for maximum flexibility in your measurement workflow.
Further information including Applications Notes, Tutorials and Webinars available here.
Download XRF Family product overview brochure here.
Download Fischer products overview brochure here.
For further information, please contact