In the next webinar from SIOS, on Sept. 30, 2021, SIOS senior technical experts Dr. Denis Dontsov and Enrico Langlotz will give you insights into nanometrology.
The webinar will be held at two time slots, 4:00pm and 11:00pm ACST time (Adelaide), or 4:30pm and 11:30pm AEST time (Australian Eastern States). Both webinars will be conducted in English.
Learn how to measure the invisible with SIOS most accurate measurement systems in our approx. 45-minute webinar.
The webinar is particularly suitable for metrologists, engineers, designers, quality managers, project managers and scientists from the fields of metrology, nanopositioning, coordinate metrology, the optics industry, precision equipment manufacturing and research and development.
Today’s technological developments follow a common trend in many manufacturing industries: Products are becoming more complex and powerful, the demands on manufacturing quality are constantly increasing, while components and object structures are becoming smaller and more compact.
In turn, the increasing industrial use of micro- and nanotechnological objects leads to ever higher demands on the measurement technology used in manufacturing, verification and positioning. The tasks are realized on objects that are getting larger and larger, so that a link between the macro- and nano-worlds has to be made.
Nanometrology is not only of great interest to the research or semiconductor industry, as a driver of the trend, it has long since found its way into areas such as nanoelectronics, microoptics, genetic engineering, molecular biology, materials research and many more.
In this approximately 45-minute webinar, you will learn how to measure the invisible with the most accurate measurement systems available from SIOS.
SIOS experts Dr. Denis Dontsov and his colleagues will provide information on the following main topics:
- ultra-stable high-resolution laser interferometers
- the basics of nanopositioning
- application of nanopositioning and nanomeasuring machine
Our speakers will be very happy to answer your questions about nanometrology after the presentation.
More information can be found here.
Registration is free online. For the first webinar click here. For the second webinar, click here.