The Thorlabs LCC7201C Birefringence Imaging System measures stress- and strain-induced birefringence in flat samples for a variety of applications ranging from materials and biological research to product assurance. This system is designed for use in academic research, medical diagnostics, industrial manufacturing, and product quality assurance. Since it is based on a liquid crystal device, there is no internal mechanical movement, leading to very stable, vibration-free operation.
- Measurements of Retardance and Azimuth (Fast Axis Orientation) in Flat Samples
- Stress- and Strain-Induced Birefringence Imaging
- Measure Ø20 mm Field of View in <20 s
- Additional Sample Mounting Accessories Available
The illumination wavelength of the standard imaging system is 633 nm. This wavelength can be customized from 488 nm to 780 nm. The system provides a Ø20 mm field of view and measures retardance up to a half-wave (316 nm) and azimuths up to ±90°. The specifications of the LCC7201C system are outlined in the Specs tab.
A Windows®-based software package is included with the LCC7201C system that contains every feature needed for system control and data acquisition. To view additional information about this system's software features and sample measurement results, please refer to the Software tab above.
For applications requiring imaging with higher spatial resolution, the Thorlabs CM50x Cerna® Birefringence Imaging Microscopes offer the same retardance and azimuth range and accuracy, with a 1.055 μm spatial resolution using the included 10X objective.
Sample Mounting Options
For sample viewing, the LCC7201C system includes Thorlabs' MLS203P2 Sample Holder. It also includes three sample holder adapters that are sized to hold Ø1/2”, Ø1”, and 2” x 2” optics. The MLS203P2 sample holder provides manual adjustment in the X direction, which is useful for samples larger than the Ø20 mm field of view. For sample rotation, the standard sample stage can be replaced with the MSB2328(/M) breadboard and MPSHA1 adapter. Additionally, larger samples can be scanned by upgrading the system with Thorlabs' MLS203-1 Fast XY Scanning Stage or LPXY1 Low-Profile XY Scanning Stage, which provide manual and motorized adjustment in both the X and Y directions. Examples of sample mounting options are shown below.
Features
- Built-In 633 nm LED Light Source
- Measures Sample Retardance up to a Half-Wave (316 nm) and Azimuths up to ±90°
- Ø20 mm Field of View
- Included with the LCC7201C Birefringence Imaging System
- MLS203P2 Sample Holder
- Sample Holder Adapters for Ø1/2", Ø1", and 2" x 2" Optics
Software
The LCC7201C system includes a Windows®-based software package that contains every feature needed for system control and data acquisition. Please click the Software button to the right to download the latest software for this system.
Features
- Standard and Low Noise Modes for Retardance Measurements
- Selectable Rectangular or Circular Region of Interest (ROI)
- Adjustable Dynamic Camera Settings (Gain, Exposure Time, Black Levels)
- Overexposure Detection
- Auto Adjustment of Light Source Level
- 1D, 2D, and 3D Measurement Result Displays
- Data Output in Binary, CSV, and Image (PNG and TIFF) Formats
The LCC7201C software includes two modes, Standard Mode and Low-Noise Mode, to measure a sample's retardance. Standard Mode provides a higher measurement rate with a lower signal-to-noise ratio, while Low Noise Mode provides a lower measurement rate with a higher signal-to-noise ratio. An exposure time of 10 ms is set as the default, which allows a measurement to be finished within 20 seconds in Standard Mode and 4 minutes in Low Noise Mode.
These two modes provide two ranges of measurement accuracy: Standard Retardance Range and Low Retardance Range. Standard Retardance provides a measurement accuracy of ±10 nm for retardances in the 0 nm to 316 nm range and ±3° for azimuths over the entire measurement range. Low Retardance Range will improve the measurement accuracy to ±1 nm for retardances in the 0 nm to 100 nm range and ±1° for azimuths over the entire measurement range. The minimum exposure time is 0.021 ms, and the maximum exposure time is 7330 ms.
Below are screenshots from the included user interface, showing the different measurement display modes available. The Preview, 1D, 2D, and 3D views are all of a plastic ruler (stress-induced birefringence).
