• Nanonics SPM & NSOM Systems

    Nanonics SPM & NSOM Systems

    Nanonics provides the most comprehensive range of unique SPM, NSOM or SNOM systems available today. NSOM (SNOM) systems for transmission, collection and true reflection NSOM imaging are available. All our systems both AFM and NSOM provide for a completely free optical axis from both above and below, thus allowing for transparent SPM integration with standard optical microscopes both upright, inverted and unique dual (or 4pi) microscopes. 

  • Nanonics Multiview 1500

    Nanonics Multiview 1500

    The award winning Nanonics MultiView 1500 is an entry-level system that fully integrates all forms of scanning probe microscopy (SPM) with conventional optical microscopy.

  • Nanonics Multiview 2000 Advanced Single Probe Scanning Probe Microscope

    Nanonics Multiview 2000 Advanced Single Probe Scanning Probe Microscope

    The NanonicsMultiView 2000 series is an advanced single probe scanning probe microscope enabling a variety of modes of AFM/SPM/NSOM imaging.

  • Nanonics Multiview 4000 Multi-Probe Optically Integrated AFM-Raman-NSOM

    Nanonics Multiview 4000 Multi-Probe Optically Integrated AFM-Raman-NSOM

    The power of independently controlled multiprobe AFM with all SPM modes is exclusively and only available today in the NanonicsMultiview 4000.

  • Nanonics Imaging CryoView Low Temperature AFM

    Nanonics Imaging CryoView Low Temperature AFM

    Multi-Dimensional Measurements in Environmental Chamber

    The Cryoview enables measurements of low temperature electrical, optical, magnetic, and thermal properties of materials fully integrated with near-field and far-field optics, Raman, and fluorescence spectroscopies. It opens new avenues for multiprobe measurements including transport properties of materials at temperatures as low as 10K.  The CryoView is an award-winning, must-have tool especially suited to probe 2D materials such as graphene, MoS2, BN, TaS2, NBSe2, WS2, HfO2, metamaterials, and metasurfaces as well as other functional material materials such as Si, carbon nanotubes, III-V semiconductors, and quantum dots.  

  • Nanonics Imaging: Combined SEM/FIB/AFM

    Nanonics Imaging: Combined SEM/FIB/AFM

    Electron microscopes are a driving force in the nanotechnological revolution. Atomic force microscopy along with scanning tunneling microscopy is another enabling technology in the growing field of nanotechnology. These two worlds, although highly complementary, have generally been separate and apart. For the first time ever,Nanonics Imaging Ltd, in its drive for integrated microscopic solutions has now been able to fully and transparently integrate these two worlds.

  • Nanonics Hydra BioAFM: AFM for biological samples

    Nanonics Hydra BioAFM: AFM for biological samples

    Nanonics, the leading provider of cutting-edge AFM technology, is proud to present its newest breakthrough in bio atomic force microscopy: the Hydra BioAFMTM featuring VISTATM (Vivid Imaging Soft Touch AFM) mode. This innovation offers ultrasensitive single pN force mapping combined with the benefits of super-resolution optical/fluorescent imaging. Live cell imaging with <100nm optical resolution and direct correlation with AFM topography is now possible. The finest structures, such as microvilli, can now be analyzed with on-line mechanics. The Hydra BioAFM, with its single or multi-probe capability, allows versatile optical integration with dual microscopes & side illumination. The system enables super-resolution methods like STED, PALM, STORM, and live cell NSOM with any available dye.

  • Nanonics Imaging SpectraView MV2500: Colocalized IR-THz-Raman-AFM

    Nanonics Imaging SpectraView MV2500: Colocalized IR-THz-Raman-AFM

    Nanonics announce the release of the SpectraView MV2500, a breakthrough system combining complementary scattering techniques with Ultrasensitive AFM and SPM for Nano-Chemical Analysis. Read more below.

Metrology