Nanonics CryoView 2000


The Nanonics CryoView 2000™ introduces the world of integrated microscopy to low temperature research. With simultaneous NSOM, AFM and Confocal imaging, complementary techniques can be used to analyze samples at low temperatures and high vacuums 

  • The First Low Temperature System with optical access from above and below the sample
  • Simultaneous AFM and NSOM at Temperatures down to 10K
  • Large scan range 50um in the XY plane
  • Z-scanning over 25um
  • 5x10-8 Torr High Vacuum Chamber
  • Unit mounted on standard upright, inverted or dual microscope

Integration onto Standard Optical Microscopes

The unique Nanonics system architecture is designed for integrated microscopy. The CryoView 2000™ X-Y-Z scan stage, the 3D FlatScan™ and the use of cantilevered optical fiber probes all leave the optical axis completely free. Therefore the sample can be viewed with standard upright, inverted or dual optical microscopes. These advances in system architecture allow lenses with high numerical apertures and magnifications to be used when the CryoView 2000™ is placed beneath an upright microscope.
The CryoView 2000™ system shown under the objective of a standard upright Olympus microscope

High Vacuum Chamber

The CryoView 2000™ is designed around a central 5x10-8 Torr vacuum chamber. Each side of the octagonal chamber is equipped with a port to add flexibility to the system. When used for low temperature work, a vacuum pump station is connected to the chamber and evacuates the cryostat for operation at an interim temperature of <25 K. The chamber can be connected to a high vacuum pump station and a transfer line from a dewar that contains the cryogen for low-temperature operation at temperatures down to 10K. 

Localized Low Temperature Operation

The cryogen is transferred through the transfer tube to cool the cold finger. The sample is cooled by copper braids connecting the cold finger to the sample. The stepper motors and the piezoelectric elements of the 3D FlatScan™ are not maintained at low temperature. Therefore the positioning of the sample and the scanning range of the tip scanner are not altered by working at low temperature.

The CryoView 2000™ uses the 3D FlatScan™ technology developed by Nanonics. A novel planar, folded-piezo, flexure scan design allows simultaneous lateral and axial sample scanning. The ultra thin package and open optical axis permits the scanner to be incorporated into systems where conventional scan stages are too bulky and geometrically awkward. The CryoView 2000™ uses two 3D FlatScan™ scanners to provide 1nm resolution in the tip scanner and 0.02nm resolution in the sample scanner in the x, y and z directions. The minimal stage height of 7 mm allow for easy access with high powered microscope objectives from either above or below the scanning stage. The large vertical (axial) displacement of up to 70 microns simplifies approaching a sample and allows tracking of structures with very large topographical features. 




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