• Hot off the Press: Nanonics announce publication of Conductive Atomic Force Microscopy

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    Nanonics is pleased to share the news of the recent publication of Conductive Atomic Force Microscopy: Applications in Nanomaterials,edited by Mario Lanza (Publisher: Wiley-VCH) , the first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. The book includes a chapter entitled "Multiprobe Electrical Measurements without Optical Interference," written by Nanonics team members. This new publication will no doubt contribute greatly to the field of CAFM.

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  • Nanonics Imaging: Breakthrough Study Sheds New Light on Graphene

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    Credit: Fang et al. ©2016 American Chemical Society

    Recent Study Demonstrates Innovative Enhanced Graphene Photodetector with Plasmonic Fractal Metasurface 

    Graphene is a very promising material for photo detection due to its unique properties, e.g. ultrabroadband optical absorption, ultrafast electron speed, and wavelength independent absorption. However, single layer graphene - with only single atom depth - exhibits very low optical absorption, which limits its application in photodetection systems.

    A recent study by Jieran Fang et al, published in NanoLetters, demonstrates a new path forward for significant photo detection enhancement in graphene.  In this paper, which was also highlighted in the February 2017 issue of the American Physical Society, researchers designed a gold fractal metasurface, similar in shape to a snowflake, and measured its electromagnetic character. As part of this study, a Nanonics MV2000 NSOM system was employed for plasmonic characterization of the snowflake metasurface with near field collection mode NSOM.

    The obtained results demonstrated strong plasmonic generation near the branches and the edges of the fractal structure. It was demonstrated that the fractal metasurface integrated in graphene photodetector as source and drain provided enhancement factors of over 8-13. Additional advantages of this new enhanced graphene photodetector are broadband and polarization insensitive. This work indicates the great potential of enhanced graphene photodetectors in photodetection technology. 

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  • Nanonics Hydra BioAFM: Correlating Optical Super-resolution with AFM

    HydraBio

    Nanonics, the leading provider of cutting-edge AFM technology, is proud to present its newest breakthrough in bio atomic force microscopy: the Hydra BioAFMTM featuring VISTATM (Vivid Imaging Soft Touch AFM) mode. This innovation offers ultrasensitive single pN force mapping combined with the benefits of super-resolution optical/fluorescent imaging. Live cell imaging with <100nm optical resolution and direct correlation with AFM topography is now possible. The finest structures, such as microvilli, can now be analyzed with on-line mechanics. The Hydra BioAFM, with its single or multi-probe capability, allows versatile optical integration with dual microscopes & side illumination. The system enables super-resolution methods like STED, PALM, STORM, and live cell NSOM with any available dye.

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  • IR Synchrotron Radiation for Near-Field AFM-IR Imaging demonstrated with Nanonics AFM and probes

    Nanonics

    The Nanonics system featured in the front center of the DLS laboratory.

    Tuesday, 13 September 2016:  Using the Nanonics MultiView 1000 AFM, Nanonics' fiber probes and scanning thermal microscopy probes, a team of scientists led by Dr. Gianfelice Cinque at UK's Diamond Light Source (the national UK synchotron facility) coupled AFM to a synchotron IR beamline in order to break the diffraction limit in the IR.   For the first time, IR synchotron radiation was used as a broadband source for photothermal IR spectroscopy.  They compare two signal transduction measurements of cantilever resonant thermal expansion and scanning thermal microscopy.  Very high signal to noise ratios were observed for both methods thanks to the brightness and broadband capabilities of the synchotron IR source, but the authors conclude that the cantilever resonant thermal expansion offered the highest signal to noise ratio.

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  • High Efficiency Vertical Light Emission measured with Nanonics MV4000

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    Nanonicscongratulates Dr. Haiyang Huang, Dr. Hao Li and a team of scientists from the Shanghai Institute of Microsystem and Information Technology, CAS, on their recently published paper "High-Efficiency Vertical Light Emission through a Compact Silicon Nanoantenna Array” (ACS Photonics).

    These researchers used a Nanonics MV4000 system to measure the emission light spot. Using a 200nm scanning aperture probe and reflection NSOM connecting with a TM polarized light beam, the authors scanned and mapped the Silicon Nanoantenna Array. Ther result was a subellipse shape, that was even more compact then anticipated.

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  • Nanonics Imaging Ltd receives Microscopy Today Innovation Award for 2015

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    Nanonicsis the proud recipient of the 2015 Microscopy Today Innovation Award for development of the CryoView MP system for low temperature, multiprobe scanning probe microscopy. These innovation awards are presented for the top 10 innovations in the field of microscopy by Microscopy and Analysis magazine and were presented at the 2015 Microscopy and Microanalysis conference in Portland, Oregon in August. This award follows the 2013 Microscopy Today award to Nanonics Imaging for its AFM-SEM-FIB microscope. These awards acknowledge outstanding advances in scientific research by Nanonics Imaging, including scanning probe microscopy, Nanonics’ area of expertise.

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  • Nanonics triple beam AFM SEM FIB system is one of the ten best microscopy innovations in 2013

    Nanonics

    The award winning Nanonics3TB4000, an integrated
    AFM/SEM/FIB system

    Nanonicsis  proud to announcethat their triple beam integrated AFM/SEM/FIB system, the Nanonics 3TB4000, was judged one of the ten best microscopy innovations in 2013 and is the recipient of the prestigious 2013 Microscopy Today Innovation Award. The 3TB4000 provides the ultimate 3D nanoscale characterization capability through a revolutionary innovation of open architecture that provides open access to the SEM/FIB beams without any obstruction or interference to the injectors, detectors, or beam lines.

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  • Nanonics' Optometronic 4000 'SPM Technology at its finest'!

    Nanonics

    The Nanonics’ Optometronic 4000 Nanophotonics Meteorology Platform was recently reviewed on the MicroscopeMaster.com website.  In this detailed analysis of the system the first photonics workstation was described as “SPM Technology at its finest”.  Read the detailed review of this award-winning producthere

    For more information about the Nanonics’ Optometronic 4000, click here.

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  • Nanonics MultiView: Simultaneous AFM-Raman Imaging and TERS

    Nanonics Imaging pioneered the field of AFM-Raman/TERS (Tip Enhanced Raman Spectroscopy) with the MultiViewTM series. Its hallmark free optical axis allows for seamless integration with any Raman system, whether upright or inverted. Integration Packages are available for a variety of Raman manufactures including HORIBA Jobin Yvon. These state-of-the-art integrations mark the beginning of a new era in high-resolution Raman spectroscopy.

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