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Phaseview ZeeScan 3D Microscope Add-on: Upgrade Your Microscope With 3D Surface Metrology Capabilities

The Phaseview ZeeScan is a fast, precise, affordable 3D add-on for microscopy. ZeeScan features the most advanced properties for fast and precise z-scanning. Instead of using traditional motorized means such as stepper motors or piezo devices, ZeeScan uses a proprietary PhaseView optical assembly for 3D scanning integrating the latest advances of digital lens technology, leading to accurate and highly repeatable z-steps for 3D acquisition ad analysis.

 Typical Use: 

  • Life Sciences & Material Microscopy
  • Fast Z-stack;
  • 3D Microscopy
  • Rapid Screening
  • Autofocus
  • Z Depth Measurement
  • 3D Surface Analysis.

Key Advantages

  • Fast scanning with response time < 5ms 
  • Compatible with any microscope equipped with video port
  • Compatible with any C-mount Camera
  • Z-Scans at any objective, no adapter required
  • No sample perturbation : no objective or stage movement causing vibrations
  • Sample space kept totally free
  • Single USB connection to PC

Software:

ZeeScan is supplied with GUI software GetPhase. An optional API/ SDK is provided for microscopy automated systems with comprehensive 3D acquisition & analysis tools.

ZeeScan is supplied with the Graphics User Interface « GetPhase « and a System Calibration software. An optional API / SDK is provided for integration purpose. All software are XP, Vista, 7, 8 (32 / 64 bit) compatible, and Graphics Processor Units (GPU) compatible.

GetPhase GUI (included)

Main features:

  • 2D / 3D acquisition modes: 2D, Z-stack, 3D roughness, 3D Shape
  • Multiple display modes : 3D, Phase, DIC, Darkfield, Image fusion (Extended Depth of Field)
  • 2D / 3D analysis tools : profiles, step height, roughness, etc.
  • Report & Export Data

GetPhase includes 3 different methods for Z axis and 3D acquisition:

Z Height measurement / Z-Stacking: relies on the unique Z-scanning capability of the PhaseView optical assembly providing accurate and repeatable Z steps.

3D Roughness Measurement: relies on proprietary wavefront technique, for measuring surface topography in reflection. The algorithm processes a set of 2 or more images acquired within objective depth of field. This method is particularly useful for measuring small surface variations, when sample features are all in-focus, within depth of fiel of the selected objective. The 3D reconstruction is determined by the maximum slope constraint; samples with steep slopes require high objective magnification as related to objective numerical aperture (NA).

3D Shape Measurement: relies on detecting local contrast on Z image series for measuring depth map of an object. The algorithm processes Z-stack images acquired beyond the objective depth of field. This method is well adapted to samples having surface variations beyond objective depth of field. 3D reconstruction is performed when samples exhibit some contrast along the Z image planes.

System_Calibration software (Included)

Main features:
XY calibration for each objective magnification
Z-stack alignment parameters calculation
Calibration data are stored in acquisition system memory

API / SDK (Optional)

Routines for Z-stack acquisition and for controls z-scanning parameters
Functions for 3D reconstruction, image fusion (EDF) , multiple views and 3D surface analysis

 

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