• Abberior Instruments and Super Resolution Microscopy at Lastek
    Abberior Instruments and Super Resolution Microscopy at Lastek

    Abberior Instruments has partnered with Lastek in Australia and New Zealand to offer the most complete experience for super resolution microscopy. Read more here.

  • Raptor Photonics OWL 640 SWIR camera
    Raptor Photonics OWL 640 SWIR camera

    Raptor Photonics OWL 640 is the best performing SWIR camera in the world. Demonstration system now available. Please enquire for details. Read more.

  • Toptica: DL pro with Digital Laser Controller DLC pro
    Toptica: DL pro with Digital Laser Controller DLC pro

    The new digital laser controller for TOPTICA’s tunable diode laser DL pro sets new benchmarks with regards to low noise and low drift levels.

    Demonstration system now available. Please enquire for details. Read more...

  • High Finesse Laser Spectrum Analyzer Spectrometer for Broadband Sources
    High Finesse Laser Spectrum Analyzer Spectrometer for Broadband Sources

    Analyses multi-line or broadband spectra of cw and pulsed lasers, gas discharge lamps, and more.  Lastek currently have a demonstration system available for evaluation. Read more...

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    Alio Industries: True Nano™ Precision Motion Systems

    ALIO Designs and Manufacturers Proprietary Robotic Devices and Tools that Enable Precise Nano-Scale Movements for Manufacturing and Research & Development

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Ellipsometry: A Versatile Technique for Thin Film Measurement

Ellipsometry is a versatile and powerful optical technique for the characterisation of thin films in a very wide variety of contexts and applications. It works by measuring the change in the state of polarisation of light reflected off the surface of the film. Its extremely high sensitivity makes it an unequalled tool for the metrology of thin film surfaces. Lastek offers a selection of ellipsometers, from Nanofilm

From Nanofilm, Lastek offers the EP3 Series of Imaging Ellipsometer (shown above). Combining ellipsometry with microscopy, these imaging ellipsometers operate on the principle of classical null ellipsometry and real-time ellipsometric contrast imaging. The technique has been utilized in surface analysis for more than 6 years and has a unique lateral resolution of 1 µm. Lateral structures less than 1 µm can be studied with the Scanning Probe Ellipsometric Microscope (SPEM). SPEM is a combination of the Imaging Ellipsometer with a Scanning Probe Microscope.

If you have a measurement problem or application involving thin films, we invite you to contact Lastek today to discuss how one of these systems might be able to assist.

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