• Abberior Instruments and Super Resolution Microscopy at Lastek
    Abberior Instruments and Super Resolution Microscopy at Lastek

    Abberior Instruments has partnered with Lastek in Australia and New Zealand to offer the most complete experience for super resolution microscopy. Read more here.

  • Raptor Photonics OWL 640 SWIR camera
    Raptor Photonics OWL 640 SWIR camera

    Raptor Photonics OWL 640 is the best performing SWIR camera in the world. Demonstration system now available. Please enquire for details. Read more.

  • Toptica: DL pro with Digital Laser Controller DLC pro
    Toptica: DL pro with Digital Laser Controller DLC pro

    The new digital laser controller for TOPTICA’s tunable diode laser DL pro sets new benchmarks with regards to low noise and low drift levels.

    Demonstration system now available. Please enquire for details. Read more...

  • High Finesse Laser Spectrum Analyzer Spectrometer for Broadband Sources
    High Finesse Laser Spectrum Analyzer Spectrometer for Broadband Sources

    The High Finesse LSA Laser Spectrum Analyser analyses multi-line or broadband spectra of cw and pulsed lasers, gas discharge lamps, and more.  Lastek currently have a demonstration system available for evaluation. Read more...

  • Alio Industries: True Nano™ Precision Motion Systems
    Alio Industries: True Nano™ Precision Motion Systems

    ALIO Designs and Manufacturers Proprietary Robotic Devices and Tools that Enable Precise Nano-Scale Movements for Manufacturing and Research & Development

    Read more...

Phaseview: Beamwave

Phaseview Beamwave

Instant Laser Beam Profiler: Entire Beam Visualization & Wavefront Analysis in One Shot

With no moving parts or additional accessories, Phaseview 's BeamWave performs real-time measurements of all critical laser beam characteristics including intensity distribution, wavefront and beam propagation parameters.

Thanks to its capability to measure simultaneously intensity and phase data at ultra high resolution, beam shape and intensity distribution can be measured at any distance from the device’s measurement location without moving parts. All critical data for laser beam monitoring such as power distribution and beam propagation parameters can be measured without additional tools.

BeamWave® provides high resolution wavefront data which allow laser beam analysis in its all dimensions. From the wavefront data, Zernike analysis is performed; beam’s astigmatism, other low and high order aberrations can precisely measured.

BeamWave® provides comprehensive one-shot measurements of the laser beam: beam propagation parameters such as M², divergence, tilt, Raileigh range, beam power characteristics in any XY plane along the propagation direction of the beam, thus providing an instant picture of laser beam behavior along the propagation axis.

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