• Abberior Instruments and Super Resolution Microscopy at Lastek
    Abberior Instruments and Super Resolution Microscopy at Lastek

    Abberior Instruments has partnered with Lastek in Australia and New Zealand to offer the most complete experience for super resolution microscopy. Read more here.

  • Raptor Photonics OWL 640 SWIR camera
    Raptor Photonics OWL 640 SWIR camera

    Raptor Photonics OWL 640 is the best performing SWIR camera in the world. Demonstration system now available. Please enquire for details. Read more.

  • Toptica: DL pro with Digital Laser Controller DLC pro
    Toptica: DL pro with Digital Laser Controller DLC pro

    The new digital laser controller for TOPTICA’s tunable diode laser DL pro sets new benchmarks with regards to low noise and low drift levels.

    Demonstration system now available. Please enquire for details. Read more...

  • High Finesse Laser Spectrum Analyzer Spectrometer for Broadband Sources
    High Finesse Laser Spectrum Analyzer Spectrometer for Broadband Sources

    The High Finesse LSA Laser Spectrum Analyser analyses multi-line or broadband spectra of cw and pulsed lasers, gas discharge lamps, and more.  Lastek currently have a demonstration system available for evaluation. Read more...

  • Alio Industries: True Nano™ Precision Motion Systems
    Alio Industries: True Nano™ Precision Motion Systems

    ALIO Designs and Manufacturers Proprietary Robotic Devices and Tools that Enable Precise Nano-Scale Movements for Manufacturing and Research & Development

    Read more...

Edmund Optics Chromatic Confocal Point Sensor Systems

Edmund Confocal Point Sensor System

The new Edmund Optics Chromatic Confocal Sensor Systems work on virtually any surface and material including transparent, opaque, reflective, rough and polished surfaces. Each system is designed to work in two modes: Distance and Thickness. The principal mode to which each system is calibrated is the distance mode (calibration certificate is included). The thickness mode is intended to measure thickness of transparent samples. In this mode, each system measures the distance to the front and back surface of the samples simultaneously and computes the thickness of the sample as the difference between the two positions. The Chromatic Confocal Point Sensor Systems also feature trigger modes that allow them to synchronize with external scanning devices.

The Chromatic Confocal Sensor Systems use the principles of confocal imaging and chromatic coding of the optical axis to determine the position or thickness of the target surface. Chromatic coding of the optical axis takes advantage of chromatic aberrations to focus a broadband light source on multiple points within the measuring range. The back scatter is collected and imaged through a spatial filter onto a spectrometer. The spectral response of the spectrometer defines the position of the surface at which the back scatter occurs.

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